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KMID : 0357520190420010067
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Journal of Radiological Science and Technology
2019 Volume.42 No. 1 p.67 ~ p.75
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A Simulation Study on the Transfer Characteristics of the Talbot Pattern Through Scintillation Screens in the Grating Interferometer
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Kim Dae-Seung
Kim Young-Ju
Lee Se-Ho
Lee Seung-Wook
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Abstract
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Grating interferometry based imaging technology is a kind of radiation imaging system, which can acquire not only absorption image but also phase difference and dark field image using the Talbot pattern. However, because of the technological difficulties and high cost of fabricating the gratings that make up the system, much efforts are being made to look for ways to replace them. The is a preliminary study to see how the Talbot pattern transfer through various kinds of scintillators and if the optical grating can be a way to replace the conventional absorption gratings. The geometry of the interferometer, the scintillator model, and the scintillator thickness are the main inputs for our simulation. We have used the concept of modulation for quantitative analysis of the contrast ratio of the Talbot pattern. This research is expected to provide very useful information on the design of optical gratings, which is an alternative way to analyze the Talbot pattern, which we have filed a patent on.
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KEYWORD
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Grating interferometer, Scintillator characteristic, Contrast, Modulation, Modulation transfer function
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